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Product Introduction： The I-V tester is mainly used to simulate sunlight and collect the voltammetry characteristic curve of crystalline silicon photovoltaic cells, which is generally composed of a light source system, a power supply system, a collection system, an infrared temperature probe, a reference battery, a display, and a computer (including test software). Using A+A+A+ xenon lamp transient light source that meets IEC60904-9:2020 standard, the irradiation intensity can be adjusted to 200-1200W/m2, the equipment has the function of temperature correction and light intensity correction, as well as the monitoring function of irradiance status. The device can be used for conventional polycrystalline, single crystal PERC, TopCon, heterojunction, CIGS, GaAs, CdTe and IBC cell components such as I-V curve, P-V curve, irradiance line, short circuit current, open circuit voltage, peak power, peak power point voltage, current, fill factor, conversion efficiency, series resistance, etc. Measurement of parallel
Key Parameters
Non-uniformity is ≤1%, class A+
Instability is ≤1%, class A+
? Other size is customizable
? Temperature chamber, to achieve Panfile testing and temperature coefficient.
? WPVS battery, to achieve absolute measurement
? IAM Rotating bracket, to achieve measurement from diffierent angles
? Equip with optical filter for low irradiance test
? Multi-channel temperature sensor for temperature measurement of multi-points
